Determination of the dielectric constant of niobium oxide by using combined eis and ellipsometric methods

HIGHLIGHTS

  • who: Krzysztof Fitzner and Michau0142 Stu0119pieu0144 from the Faculty of Non-Ferrous Metals, AGH University of Science and Technology, alAMickiewicza, Krakow, Poland have published the research: Determination of the Dielectric Constant of Niobium Oxide by Using Combined EIS and Ellipsometric Methods, in the Journal: Materials 2023, 16, x FOR PEER REVIEW of /2023/
  • what: In this work, the samples were mechanically polished and the measurements were made in ex situ conditions. A single-layer model, whose impedance is given by Equation , returns good fit of results for the oxide layer obtained in the anodizing voltage . . .

     

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