HIGHLIGHTS
- who: Yosuke Iwamoto and Tatsuhiko Sato from the Nuclear Science and Engineering Center, Japan Atomic Energy Agency, Ibaraki, Japan Editor:, University of Liverpool have published the paper: Development of a method for calculating effective displacement damage doses in semiconductors and applications to space field, in the Journal: PLOS ONE of 20/04/2022
- what: This work developed a new model for calculating the conventional and effective DDD values for silicon carbide (SiC) indium arsenide (InAs) gallium arsenide (GaAs) and gallium nitride (GaN) semiconductors.
- how: The results indicated that the effective DDD could be . . .
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