HIGHLIGHTS
- who: Zhenrong Zhang and collaborators from the Key Laboratory of Instrument Science and Dynamic Testing Ministry of Education, North University of China have published the research: Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy, in the Journal: Scanning of 12/08/2022
- what: In this review, the authors focus on the resonant cavity-type scanning microwave microscope. Using this approach, the efficiency of electromagnetic wave loading into the tip sampling system is improved, and the measured values of thermal parameters of the chip are obtained using a noncontact scanning mode.
- how: For . . .
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