Dielectric screening versus geometry deformation in two-dimensional allotropes of silicon and germanium

HIGHLIGHTS

• who: Antonello Sindona from the PBucci, C, Facultad de Ciencias have published the article: Dielectric screening versus geometry deformation in two-dimensional allotropes of silicon and germanium, in the Journal: Scientific Reports Scientific Reports
• what: The authors focus on the energy loss (EL) function Eloss=-Im(1/u03b5 M ) for probing energies u03c9, in the mid-IR to extreme-UV range, and momentum transfers q, along the whole u0174K and u0174M paths of the 1st BZ, reported in Fig 1g. To further clarify the picture, the authors explore the energy loss properties of half buckled . . .
  

   

  

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