Discovery and identification of memory corruption vulnerabilities on bare-metal embedded devices

HIGHLIGHTS

  • who: -IoT security et al. from the Size Inc(%) , , , , , , , , , have published the paper: Discovery and Identification of Memory Corruption Vulnerabilities on Bare-Metal Embedded Devices, in the Journal: (JOURNAL) of 26/02/2021
  • what: The authors propose the first ground-truth benchmark suite for fuzzers that enables accurate and consistent evaluation of their vulnerability-finding performance. The authors provide background information on memory corruption vulnerabilities and fuzzing as an approach to discover them, and discuss some limitations related to the architecture of bare-metal devices that motivate the need to extend and refine the fuzzing . . .

     

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