HIGHLIGHTS
- What: The authors propose a phenomenological model that describes the defect dynamics in VCSELs.
- Who: PJ- and colleagues from the (UNIVERSITY) have published the research work: Dynamic modelling of stress-induced defect expansion in VCSELs, in the Journal: (JOURNAL)
SUMMARY
Although analyses on the root cause and intrinsic mechanism of defect formation and expansion were mainly based on theoretical speculations, these studies managed to provide several possible degradation modes of VCSELs and explained the nature of defects, their origin, and potential mechanisms of their expansion. Due to the multiple-origin nature . . .
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