HIGHLIGHTS
- who: Zhengjun Liu and Li Wang from the State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China have published the Article: Electrical Life Assessment of the Low-Voltage Circuit Breaker (LVCB) Considering Arc Voltage, in the Journal: Energies 2022, x of 22/04/2022
- what: This work investigates the effect of on breaking current develops an erosion model that includes and compares the CEA curves for various supply voltages and power factors. The contact wear caused by electrical stress is the main reason for the LVCB's degradation . . .
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