HIGHLIGHTS
- who: Rietveld and collaborators from the Department of Industrial Engineering, University of Trento, Via Sommarive, Trento, Italy* have published the article: Electron diffraction characterization of nanocrystalline materials using a Rietveld-based approach. Part I. Methodology, in the Journal: (JOURNAL)
- what: In this paper, we demonstrated the applicability of Rietveld refinement to the analysis of electron diffraction ring patterns, as concerns the methodology for calibrating camera lengths and instrumental broadening based on FWHM and integral breadth.
- how: For a comparative estimation of the average crystallite size the authors considered a dark-field (DF) image . . .
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