Enhanced you only look once x for surface defect detection of strip steel

HIGHLIGHTS

• who: Feng Zhou from the Nanjing University of Science and Technology, China have published the research: Enhanced You Only Look Once X for surface defect detection of strip steel, in the Journal: (JOURNAL)
• what: The major objective of this paper is to improve the speed and accuracy of the detection of surface defects in strip steel. The model shown in Scenario 3 is the optimal model for this paper.
• how: Showed that the new network achieved 78.25 mAP and improved by 2.92% over RetinaNet. To improve the detection accuracy of the . . .
  

   

  

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