Euclid preparation – xviii. the nisp photometric system

HIGHLIGHTS

• who: Euclid Collaboration and collaborators from the The temperature dependence is caused by the thermal contraction of the dielectric coating layers, as well as a change in neff (e_g Tan and Arndt, for Si, )To quantify these effects, YE, JE, and HE, band coating samples were cryocycled in a vacuum chamber at Martin-LutherUniversity Halle-Wittenberg (Germany), while simultaneously recording their transmission. We determined the cut-on and cutoff in the same manner as for the actual filters. As expected, the passbands redshift slightly when going into vacuum, and experience a larger blueshift when cold have published . . .
  

   

  

  If you want to have access to all the content you need to log in!

  Thanks :)

  Username or Email

  Password

  Remember me

  Lost your password?

  If you don't have an account, you can create one here.