HIGHLIGHTS
- who: Olivier Douhéret and colleagues from the University Lille, CNRS, Centrale Lille, University Polytechnique Hauts-de-France, UMR, IEMN have published the research work: Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers, in the Journal: (JOURNAL)
- what: SMM equipped with a Mach-Zehnder interferometer to allow for 50 Ω free detection system and probing high impedance semiconducting materials was applied to electrically characterize P3HT as a reference semiconducting polymer in a Metal-Insulator-Semiconductor structure.
- how: In this work SMM is applied on poly(3-hexylthiophene-25-diy) (P3HT) .
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