Fast and robust characterization of lossy dielectric slabs using rectangular waveguides

HIGHLIGHTS

• who: Xuchen Wang et al. from the (UNIVERSITY) have published the research: Fast and Robust Characterization of Lossy Dielectric Slabs Using Rectangular Waveguides, in the Journal: (JOURNAL)
• what: The authors provide an analytical extraction formula for thin-layer dielectric samples. The authors propose such a method that can be used to measure arbitrary-shaped dielectric slabs outside rectangular waveguides (see Fig 1). C HARACTERIZATION OF E LECTRICALLY T HIN D IELECTRIC S LABS Next, the authors discuss how Y p is related to the permittivity of the dielectric slab under test. In the first analysis . . .
  

   

  

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