Fast dark signal measurements of svom vt ccds using the vertical gradient of dark field images

HIGHLIGHTS

  • who: Yue Pan and colleagues from the University of Chinese Academy of Sciences, Beijing, China have published the article: Fast Dark Signal Measurements of SVOM VT CCDs Using the Vertical Gradient of Dark Field Images, in the Journal: Photonics 2021, 132 of 20/04/2021
  • what: The main reason is that changes little with the decrease in temperature below -70 u00b0C. Therefore, the final on-orbit CCD suppresses the surface dark signal. Two curve fitting formulas obtained by the analysis of dark signal sources are adopted to the dark signal temperature dependence for AIMO CCD . . .

     

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