HIGHLIGHTS
- who: (Received et al. from the Department of Materials Science and Engineering, UC Berkeley, Berkeley, CA, USA have published the Article: Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization, in the Journal: (JOURNAL)
- what: In the work , 4D-STEM is implemented in combination with fast electron detection to explore new possibilities for high-throughput grain mapping at high spatial resolution. As the authors show here, 4D-STEM without precessing the beam presents a powerful technique for grain orientation mapping when both . . .
If you want to have access to all the content you need to log in!
Thanks :)
If you don't have an account, you can create one here.