HIGHLIGHTS
- who: Frumin Leonid et al. from the of Automation and Electrometry, SB RAS, Novosibirsk, Russia State University have published the article: Frustration of total internal reflection by a hidden nanowire, in the Journal: (JOURNAL)
SUMMARY
A metallic wire embedded in the dielectric substrate leads to frustration of the total internal reflection at the interface between dielectric and free space. The p-wave incidenting by the angle close to total reflection with the frequency near plasmonic resonance is treated by the modified boundary elements method. The scattering of evanescent wave by pArticles is important . . .
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