Holistic optimization of trap distribution for performance/reliability in 3-d nand flash using machine learning

HIGHLIGHTS

• who: KIHOON NAM and collaborators from the of Electrical Engineering, Pohang University of Science Technology (POSTECH), Pohang, Republic of Korea have published the research work: Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning, in the Journal: (JOURNAL)
• what: The authors have attempted to solve more complicated problems combined with retention characteristics by optimizing the critical properties of CTN, that is, uneven spatial and energetic trap distributions, by using a deeper neural_network.
• future: Machine learning (ML) in this study can help in determining the optimal values . . .
  

   

  

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