HIGHLIGHTS
- who: Jingyu Cui et al. from the The College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China have published the research work: Impact Ionization Coefficient Prediction of a Lateral Power Device Using Deep Neural Network, in the Journal: Micromachines 2023, 14, 522. of /2023/
- what: In this paper, to accurately obtain the analytical breakdown voltage of lateral power devices, the modified impact ionization coefficient is first proposed in order to demonstrate the influence of 2D effects on impact ionization and avalanche breakdown in silicon-on-insulator (SOI) lateral power . . .
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