Improve model testing by integrating bounded model checking and coverage guided fuzzing

HIGHLIGHTS

  • who: Yixiao Yang from the College of Information Engineering, Capital Normal University, Beijing, China have published the research work: Improve Model Testing by Integrating Bounded Model Checking and Coverage Guided Fuzzing, in the Journal: Electronics 2023, 12, 1573. of /2023/
  • what: Inspired by this feature the authors propose a novel integration technology SPsCGF which leverages bounded model for symbolic execution to generate test cases as initial seeds and then conduct based upon these worthy seeds. To use that method in model testing, the model is transferred to the source code first and the fuzzing method . . .

     

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