HIGHLIGHTS
- who: Jamie I. Farquharson from the Microscopy and grainsize analysis Scanning Electron Microscope (SEM) images were collected at the University of Liverpool, with a Philips , tungsten filament SEM used on carbon-coated standard petrographic thin sections, and at Lancaster University Chemistry department with a JEOL JSM- F SEMThe grain sizes discussed here are generally too small for many conventional analyses. In order to determine a grain size distribution, the semimajor grain axis from representative D SEM images were manually measured with ImageJ. These diameters were converted to a mass distribution by assuming a spherical particle geometry, with . . .
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