In depth characterization of ge-si core-shell nanowires using x-ray coherent diffraction and time resolved pump-probe spectroscopy

HIGHLIGHTS

  • who: Sara Fernández and colleagues from the CNRS de Toulon, IM NP UMR, Marseille, France have published the Article: In depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy, in the Journal: (JOURNAL)
  • what: The authors report on the ultrafast vibrational response of single Ge-Si core-shell nanowires obtained by epitaxial growth and investigated by femtosecond transient reflectivity and coherent x-ray diffraction measurements. Coupling electron microscopy and pump and probe investigations with a very high spectral resolution performed on the same wire . . .

     

    Logo ScioWire Beta black

    If you want to have access to all the content you need to log in!

    Thanks :)

    If you don't have an account, you can create one here.

     

Scroll to Top

Add A Knowledge Base Question !

+ = Verify Human or Spambot ?