In-process cutting temperature monitoring method based on impedance model of dielectric coating layer at tool-chip interface

HIGHLIGHTS

• who: Heebum Chun et al. from the JMike , Department of Mechanical Engineering, Texas AandM University, TAMU, College Station, TX, USA have published the article: In-Process Cutting Temperature Monitoring Method Based on Impedance Model of Dielectric Coating Layer at Tool-Chip Interface, in the Journal: (JOURNAL)
• what: The study was conducted by utilizing the impedance characteristics of the dielectric outer layer of the A chemical vapor deposition (CVD) diamond coated insert that is commercially available was considered for the study to avoid wear effect. The study showed that monitoring of the temperature is possible using . . .
  

   

  

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