In situ constructing atomic interface in ruthenium-based amorphous hybrid-structure towards solar hydrogen evolution

HIGHLIGHTS

• who: Dong Liu from the Characterization methods Transmission electron microscopy (TEM) analysis was performed on a JEOL- F transmission electron microscope at an accelerating voltage of , kVEnergy dispersive spectra (EDS-mapping) were performed on a Talos F X transmission electron microscope at an accelerating voltage of , kV. The high-angle annular dark-field scanning transmission electron microscopy (AC-HAADF-STEM) was performed on a JEM-ARM F instrument (University of Science and Technology if China) with a spherical aberration corrector., ray photoelectron spectroscopy (XPS) measurements were carried out on an ESCALAB Xi instrument equipped with a Mg . . .
  

   

  

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