Influence of si wall thickness of csi(tl) micro-square-frustums on the performance of the structured csi(tl) scintillation screen in x-ray imaging

HIGHLIGHTS

• who: Zhixiang Sun from the Shanghai Key LaboratoryTongji University have published the Article: Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging, in the Journal: Scientific Reports Scientific Reports
• what: The main reason for the increase in BLO is the corresponding increase in the ratio of the filled CsI(Tl) area to that of the entire structured scintillation screen.
• future: The validity of the simulation method has been confirmed in the related preliminary experiments which will be . . .
  

   

  

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