HIGHLIGHTS
- What: The insights garnered from this study aim to arm operators with proactive measures to diminish the potential for customer complaints. This study examines how Company F (Taiwan, China), a leading semiconductor wafer manufacturer in Taiwan, tackles white pixel defects, focusing on enhancing response to customer complaints and defect analysis. By employing machine_learning techniques, the study aims to improve resource utilization and identify defect causes through reverse engineering. 7 of 26 Due to the company need to immediately resolve the white pixel defect problem, this study focuses solely on the impacted blade grinding process.
- Who . . .
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