HIGHLIGHTS
- who: August and colleagues from the University of Technology and Technology, China have published the Article: Isotropy frequency-domain extension imaging and its application in detection of nanostructures, in the Journal: (JOURNAL)
- what: The authors propose a wide-field high resolution microscopy by using the isotropy frequency-domain extension imaging (IFEI), which is capable to provide high resolution and high contrast images with sub-micron scale defects on the surface of fused silica optics for the first time.
SUMMARY
Fused silica material is widely used in high-energy laser, space detection . . .
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