HIGHLIGHTS
- who: Nicolas Bercu et al. from the Laboratoire de Recherche en Nanosciences , (LRN), Universitu00e9 de Reims Champagne-Ardenne, France have published the research: KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices, in the Journal: (JOURNAL)
- what: A non-destructive technique coupling local measurements of the surface potential by KPFM and micro-Raman spectroscopy was presented.
SUMMARY
Electronic devices based on wide bandgap semiconductors such as 4H-SiC are now widely used in power electronics. The authors a non-destructive technique for the characterization of the doped . . .
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