Laue-dic: a new method for improved stress field measurements at the micrometer scale

HIGHLIGHTS

• who: X-ray diffraction et al. from the , Marne-la-Vallée, France, dDepartment of Engineering Science, University of, Parks Road have published the research: Laue-DIC: a new method for improved stress field measurements at the micrometer scale, in the Journal: (JOURNAL)
• what: The aim of this paper is to present a new method (called Laue-DIC) in which Laue spots do not need to be fitted with an analytical function. Thanks to the high accuracy of DIC that can be of the order of a few hundredths of a pixel (Bornert et_al, 2009 . . .
  

   

  

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