HIGHLIGHTS
- who: Koji Kimoto and colleagues from the National Institute for Materials Science, Namiki, Tsukuba, Ibaraki, Japan Tohoku University have published the Article: Local structure analysis of disordered materials via contrast variation in scanning transmission electron microscopy, in the Journal: (JOURNAL) of March/16,/2018
SUMMARY
Diffractometry techniques, which utilize x_rays, neutrons, and electrons as incident beams, are indispensable for the analysis of crystal_structures in materials science. In this regard, the diffraction intensity, I( g), depends on the atomic scattering factor, f ( g), of the incident x_ray/electron (or scattering length of neutron) as . . .
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