HIGHLIGHTS
- who: Clément Marchat from the (UNIVERSITY) have published the article: Local VOC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires, in the Journal: (JOURNAL)
- what: Completed devices based on RJ SiNWs were jointly analyzed under illumination by I-V and KPFM measurements.
- how: Note that this configuration does not allow to perform SPV measurements at constant flux and for this particular reason only qualitative observations can be made.
SUMMARY
KPFM analysis on PV nanodevices is not straightforward notably due to that . . .
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