Measurement of the low-temperature loss tangent of high-resistivity silicon using a high-q superconducting resonator

HIGHLIGHTS

• who: Checchin M. from the Illinois, USA have published the research: Measurement of the Low-Temperature Loss Tangent of High-Resistivity Silicon Using a High-Q Superconducting Resonator, in the Journal: (JOURNAL) of 16/06/2022
• what: The authors report silicon-loss-tangent values at the lowest temperature and for electric field amplitudes comparable to those found in planar transmon devices and these are one order of magnitude larger than what was previously estimated. The authors demonstrate that the millikelvin Si loss tangent is one order of magnitude larger than previously estimated . In Fig 4 . . .
  

   

  

  If you want to have access to all the content you need to log in!

  Thanks :)

  Username or E-mail:

  If you don't have an account, you can create one here.