Measuring sub-surface spatially varying thermal conductivity of silicon implanted with krypton

HIGHLIGHTS

• who: Measuring sub-surface spatially varying and collaborators from the Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, Virginia, USA have published the Article: Measuring sub-surface spatially varying thermal conductivity of silicon implanted with krypton, in the Journal: (JOURNAL)
• what: The authors develop an advancement in the analysis of time-domain thermoreflectance to account for conductivity in a material resulting irradiated with Kr+ ions which has an approximate Gaussian distribution centered 260 nm into the sample. The approach to simultaneously fit the TDTR data collected using multiple modulation frequencies is described in . . .
  

   

  

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