HIGHLIGHTS
- who: Fax. + et al. from the This Article was downloaded from Harvard University's DASH repository, and is made available Massachusetts, USA have published the Article: Microstructural evolution induced by micro- cracking during fast lithiation of single-crystalline silicon, in the Journal: (JOURNAL)
- what: The authors report observations of microstructural changes in {100} and {110} oriented silicon wafers during initial lithiation under relatively high current densities. These results give a contribution of the stress to the free_energy of This analysis shows that the stress has a relatively large retarding effect for growth of a perturbation . . .
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