Modeling and electrical characterization of a bilayer pt/aln/sapphire one port resonator for sensor applications

HIGHLIGHTS

  • who: Jean Claude Asseko Ondo and colleagues from the Laboratoire Modélisation Simulation Composants (LMSC), Faculté Sciences, IJL-Institut Lamour, UMR, Université Lorraine-CNRS, Nancy, France have published the paper: Modeling and Electrical Characterization of a Bilayer Pt/AlN/Sapphire One Port Resonator for Sensor Applications, in the Journal: Electronics 2021, 370 of 29/01/2021
  • what: The study of frequencies is used to determine the eigen modes propagating in the structure, the eigenfrequencies of vibrations, and the electrical potential .
  • how: This paper presents two-dimensional FEM (Finite Element Method) modeling and simulation . . .

     

    Logo ScioWire Beta black

    If you want to have access to all the content you need to log in!

    Thanks :)

    If you don't have an account, you can create one here.

     

Scroll to Top

Add A Knowledge Base Question !

+ = Verify Human or Spambot ?