HIGHLIGHTS
SUMMARY
Abstract The single event effect caused by space heavy ion radiation is one of the important factors affecting the safety and operation of spacecraft on orbit. On the Beidou navigation M15 and M16 satellites, a single event upset (SEU) and LET monitor was developed to obtain the upsets of the memory device and the LET spectra of space radiation which passes through the device. The space radiation and their secondary particles produced can cause single event upset (SEU), single event latch-up (SEL), single event gate rupture, single event burnout and other single event . . .
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