HIGHLIGHTS
- who: Saleem Shahid and colleagues from the Department of Electrical and Computer Engineering, Air University, Islamabad, Pakistan Department of Electronics, Information, and Bio-Engineering, Politecnico di Milano, Milan, Italy have published the Article: Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method, in the Journal: Electronics 2023, 12, x FOR PEER REVIEW of /2023/
- how: This paper presents the implementation of the for the characterization and estimation of different dielectric material properties. The results were compared with different reported techniques to showcase the possible use of the presented in microwave imaging non-destructive . . .
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