On-machine detection of sub-microscale defects in diamond tool grinding during the manufacturing process based on dtoolnet

HIGHLIGHTS

• who: Wen Xue et al. from the School of Mechanical Engineering and Automation, Harbin Institute of Technology (Shenzhen) have published the article: On-Machine Detection of Sub-Microscale Defects in Diamond Tool Grinding during the Manufacturing Process Based on DToolnet, in the Journal: Sensors 2022, 22, x FOR PEER REVIEW of /2022/
• what: In thistarget paper,detection the authors propose a method for Xian the on‐machine detection of sub‐microscale combined with a triple loss network to improve the feature extraction capability neural defects in diamond tool grinding during the manufacturing process. In the . . .
  

   

  

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