Phase-controlled van der waals growth of wafer-scale 2d mote2 layers for integrated high-sensitivity broadband infrared photodetection

HIGHLIGHTS

• who: Di Wu from the (UNIVERSITY) have published the article: Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection, in the Journal: (JOURNAL)
• what: The authors demonstrate a facile thermal-assisted tellurization route for the van der Waals (vdW) growth of wafer-scale phase-controlled 2D MoTe2 layers. This work provides a new approach to assembling uncooled IR photodetectors based on 2D materials. This work provides a viable way for the development of highly sensitive 2D photodetectors for room temperature MIR photodetection and image-sensing . . .
  

   

  

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