Photon-free (s)cmos camera characterization for artifact reduction in high- and super-resolution microscopy

HIGHLIGHTS

• who: Robin Diekmann from the Heidelberg University have published the article: Photon-free (s)CMOS camera characterization for artifact reduction in high- and super-resolution microscopy, in the Journal: NATURE COMMUNICATIONS NATURE COMMUNICATIONS of 20/04/2021
• what: This approach has been used to remove camera artifacts in both single molecule localization microscopy (SMLM)1,2 and diffractionlimited imaging2-4. The authors demonstrate that the authors can accurately characterize diverse (s)CMOS cameras and use the calibrations to avoid bias in 2D and 3D SMLM and in diffraction-limited imaging. For Micro-Manager 1.4 . . .
  

   

  

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