Potential yield simulated by global gridded crop models: using a process-based emulator to explain their differences

HIGHLIGHTS

  • who: Bruno Ringeval and collaborators from the Bordeaux Sciences Agro, INRAE, Villenave d'Ornon, France University of Birmingham, Birmingham, UK have published the research: Potential yield simulated by global gridded crop models: using a process-based emulator to explain their differences, in the Journal: (JOURNAL)
  • what: Despite huge differences between GGCMs the authors show that if the authors fit both a parameter describing the thermal requirement for leaf emergence by adjusting its value to each grid-point in space as done by GGCM modellers following the GGCMI protocol and a GGCM-dependent globally uni- form . . .

     

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