Probing out‐of‐plane charge transport in organic semiconductors using conductive atomic force microscopy

HIGHLIGHTS

• What: The authors investigate 2D crystalline films of 2,9-dioctylnaphth naphth thien thiophene (C8-DNTT-C8) and demonstrate how conductive-probe atomic force microscopy (C- Adv. Mater. The authors report a novel microscopic approach based on mapping local variations in current in multi-layered OSC films, thus gaining insights into the charge transport properties at an unprecedented, single molecule length scale. The authors investigated the local electrical properties of solution-processed organic thin films of the molecular semiconductor C8-DNTT-C8, whose chemical structure is presented in Figure 1a. This apparent linear dependence between the out . . .
  

   

  

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