Proton direct ionization in sub-micron technologies: test methodologies and modelling

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  • who: -proton direct ionization (PDI and colleagues from the The extraction method for the PDI SV parameters from the DHEP S EU have published the article: Proton Direct Ionization in Sub-Micron Technologies: Test Methodologies and Modelling, in the Journal: (JOURNAL)
  • what: As discussed in the original work by Dodds et_al, the main purpose of this method is to provide estimates for PDI SERs for radiation environments behind shielding without the necessity of using the QME test method and the associated need for a LEP beam facility. The aims of this study are to: 1 . . .

     

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