Qtl mapping of yield components and kernel traits in wheat cultivars tam 112 and duster

HIGHLIGHTS

  • who: Zhen Wang from the Guangxi University, China have published the article: QTL mapping of yield components and kernel traits in wheat cultivars TAM 112 and Duster, in the Journal: (JOURNAL)
  • what: In this study, a set of 18 yield-related, and agronomic traits were evaluated in the TAM 112/Duster RIL population which was tested in 13 environments for three crop years.
  • how: To evaluate the reliability and novelty of those QTL the authors compared the physical positions of QTL identified in this study with previously reported QTL and genes based on . . .

     

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