HIGHLIGHTS
- who: Coefficient and colleagues from the (UNIVERSITY) have published the article: Reflection Calculation of Structure Including Porous Silicon Layer with Transfer, in the Journal: (JOURNAL)
- what: In the study, a two layered structure, consists of 20 nm thick PSi layer on a 30 nm thick silicon layer free standing in the air is considered. The analyzes carried out in this study show that PSi ARC ISSN: 2147-284X analysis made by using TMM will be reliable if wavelength of the incident light is much higher than the pore sizes.
- how: In this study . . .
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