HIGHLIGHTS
- who: (C) et al. from the Amsterdam BVPublished in The Netherlands have published the article: Reprints available directly from the publisher, in the Journal: (JOURNAL)
SUMMARY
Powdered samples for X-ray diffraction (XRD) analysis are seldom free from preferred orientation of the crystallites (texture) even when the material is cubic and the specimen is carefully prepared (Parrish and Huang, 1983; Will, Parrish and Huang, 1983; Schreiner and Kimmel, 1987; Will, Masciocchi, Parrish and Hart, 1987). It was not surprising to notice a texture effect in silicon during a phase composition study of ferrosilicon . . .
If you want to have access to all the content you need to log in!
Thanks :)
If you don't have an account, you can create one here.