Research archive

HIGHLIGHTS

• who: Kevin Swatton from the (UNIVERSITY) have published the research: Research Archive, in the Journal: (JOURNAL)
• what: Through SPICE simulation the authors demonstrate that the BTI aging estimation error of the proposed technique is less than 1% and 6.2% for PGDs with static operating frequency and dynamic voltage and frequency scaling respectively. The authors show that the leakage current reduction of BTI aging in nanometer technologies , impacts considerably the virtual-power-network discharge time during the standby of a PGD. In Fig 5(a), the authors show the dV characterization data when the temperature . . .
  

   

  

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