HIGHLIGHTS
- who: Ruirui Wu et al. from the School of Physics and Electronic Information, Huaibei Normal University, Huaibei , Anhui, China have published the research: Research on temperature drift mechanism and compensation method of silicon piezoresistive pressure sensors, in the Journal: (JOURNAL)
- what: In this paper the mechanism of temperature drift of silicon-based pressure sensor is analyzed initially and then a comparison between BP neural network and wavelet neural network is done which shows the root mean square error of the wavelet neural network is much smaller than that of the BP neural network and better . . .
If you want to have access to all the content you need to log in!
Thanks :)
If you don't have an account, you can create one here.