HIGHLIGHTS
- who: XFELs. et al. from the Synchrotron Radiation Laboratory, National Accelerator Laboratory, Menlo Park, USA, cDepartment of, USA, eDepartment of Structural Biology have published the article: Resolving indexing ambiguities in X-ray free-electron laser diffraction patterns, in the Journal: (JOURNAL)
- how: The XFEL diffraction data were collected at the Macromolecular Femtosecond Crystallography (MFX) endstation of the LCLS at the SLAC National Accelerator Laboratory using a goniometer-based target sample-delivery station and an automatic sample-loading system designed and adapted for XFEL diffraction experiments (Cohen et_al 2014). The synchrotron data were collected on beamline . . .
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