HIGHLIGHTS
- who: Graeme Ball from the DepartmentUniversity of have published the research work: SIMcheck: a Toolbox for Successful Super-resolution Structured Illumination Microscopy, in the Journal: Scientific Reports Scientific Reports
- what: Understanding how to verify instrument performance, tune parameters, and recognize artifacts are essential to obtaining optimal and reproducible super-resolution SIM data.
SUMMARY
| 5:15915 | Channel Intensity Profiles _CIP Plots average intensity per image plane for each angle and z-position ✓ 1a,b S3 ✓ ✓ 1c, S4 ✓ Image Processing ✓ Low Mod. T otal Intensity Variation (TIV) per angle (%) Fourier Projection _FPJ Z . . .
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