Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

HIGHLIGHTS

• who: S. Gorfman from the DepartmentUniversity of of Denmark, Lyngby kgs2800, Denmark. have published the Article: Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics, in the Journal: Scientific Reports Scientific Reports
• what: We used the resonant X-ray diffraction to simultaneously measure the structural distortions underpinning intrinsic strain, spontaneous polarization and dielectric response in BT-BZT ferroelectric ceramics.

SUMMARY

The time-dependence of the applied electric field is shown by the thick solid line in the Fig 2b: in such a double-pulse waveform . . .

 



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