Specimen-displacement correction for powder x-ray diffraction in debye–scherrer geometry with a flat area detector

HIGHLIGHTS

• who: Debye-Scherrer and collaborators from the Materials Science and Engineering, University of Illinois at Urbana-Champaign, WGreen St, Urbana, IllinoisANSTO, Australia have published the research: Specimen-displacement correction for powder X-ray diffraction in Debyeu2013Scherrer geometry with a flat area detector, in the Journal: (JOURNAL)
• what: The motivation for this study is the development of a specimen-displacement correction equation that can be implemented easily in existing Rietveld refinement software for an experimental geometry that is common at powder diffraction synchrotron beamlines. The aims for this article were to propose a Hulbert and Kriven . . .
  

   

  

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